EDN

Electroglas adds auto defect classification to wafer inspection

SAN JOSE, Calif. – Electroglas Inc., a supplier of process management tools for the semiconductor industry, has introduced automatic defect classification software that it calls DefectID. DefectID ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
Nature

Enhancing power equipment defect identification through multi-label classification methods

Accurate identification and classification of equipment defects are essential for assessing the health of power equipment and making informed maintenance decisions. Traditional defect classification ...
Nature

Research on steel surface defect classification method based on deep learning

In numerous nations, the steel industry stands as a pivotal pillar, underpinning the economic vitality of the country. Within this industry, strip steel products find extensive applications in various ...
Women's Wear Daily

Defect Calibration: A Key Tool for Reducing Errors and Chargebacks

In the fast-paced, competitive apparel and footwear industries, quality has always been important. However, with rising material and labor costs combined with the growing pressure for faster ...