IEEE

Yitao Ma

Deep Neural Network,Device Design,Neural Network,Optimization Algorithm,Semiconductor Industry,Convolutional Neural Network,Device Performance,Electrical Parameters ...
Frontiers

FAD-YOLO: a lightweight feature-refined and task-aligned framework for AIS–MIA discrimination on pulmonary CT

) reported in a multi-center study that differences in scanners, reconstruction algorithms, and imaging protocols often lead to noticeable performance degradation when models are deployed across ...