System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...
The AI revolution is significantly outpacing the IC industry’s ability to sufficiently test multi-chip systems for all necessary failure mechanisms at probe, final test, and system-level test. The ...
Tessent Streaming Scan Network (SSN) is a system for packetized delivery of scan test patterns. It enables simultaneous testing of any number of cores with few chip-level pins, and reduces test time ...
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